NEX QC+ EDXRF Analyzer
Enhanced energy-dispersive X-ray fluorescence (EDXRF) analyzer for elemental analysis.
- Non-destructive analysis for a wide range of elements.
- Advanced elemental analysis with next-generation silicon detector technology, providing significant improvements in elemental peak resolution and counting statistics
- Automatic sample changer and sample spinner for enhanced usability
- Easy-to-use interface with advanced data management, compact and portable design for lab and field use.
- Compliant with various industry standards.
Key Features
NEX QC+ is fully compliant with ASTM D4292, providing both standard method and refined methodology.NEX QC+ / X-ray fluorescence analysis
Built for demanding
applications.
When analysis time or sample throughput is critical
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the enhanced NEX QC+ spectrometer analyzer. Employing next-generation silicon detector technology, the NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.
Next generation silicon detector technology
Improved peak resolution.
Superior precision.
A detector upgrade built for the measurements that punish ordinary EDXRF.
Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.
For the most challenging measurements.
Significant improvement in elemental peak resolution and counting statistics results in superior calibrations and measurement precision.
Performance improvements
- Elemental peak resolution
- Counting statistics
- Superior calibrations
- Measurement precision
Sample handling
One chamber.
Many sample types.
A large 190 × 165 × 60 mm sample chamber accepts single-position 32 mm and 40 mm apertures, a bulk sample aperture, and optional automatic sample changers, with analysis in air or helium. The icon-driven software handles qualitative and quantitative analysis, normalization and validation, fundamental parameters, and LIMS-compatible data export, with a flow-bar wizard for building new applications.
Built for the shop floor.
Rated for ambient temperatures of 10–35°C (50–95°F) and up to 85% relative humidity, non-condensing.
At a glance
- Ambient 10–35°C (50–95°F)
- RH <85% non-condensing
- Single-phase AC, 100/240V
- 16 kg (35 lbs)
Description highlights
For demanding applications.
For challenging measurements.
- 01
Critical Priorities
Analysis time or sample throughput.
- 02
Detector Technology
Next generation silicon detector technology.
- 03
Measurement Performance
Superior calibrations and measurement precision.
Specs
| Test Method Compliance | ASTM D4294, IP 336, IP 496, ISO 8754, ISO 13032, ISO 20847, JIS K2541 | |
| Excitation | 50 kV X-ray tube 4 W max power 6 tube fi lter positions with shutter |
|
| Detection | High performance semiconductor detector Peltier thermo-electric cooling Optimum balance of spectral resolution and count rate |
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| Sample chamber | Large 190 x 165 x 60 mm sample chamber Single position 32 mm sample aperture Single position 40 mm sample aperture Bulk sample aperture 6-position 32 mm automatic sample changer 5-position 40 mm automatic sample chamber Single position 32 mm sample spinner Analysis in air or helium |
|
| Software and application packages | Qualitative and quantitative analysis Normalization and validation feature Fundamental parameters Data export function with LIMS compatibility User selectable shaping times Simple flow bar wizard to create new applications Icon driven graphical user interface |
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| Environmental conditions | Ambient temperatures 10 – 35°C (50 – 95°F) Relative humidity <85% non condensing Vibration undetectable by human Free from corrosive gas, dust, and particles |
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| User interface | 8” WVGA touch screen interface Embedded computer Internal thermal printer USB and ethernet connections |
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| Spectrometer Data | Single phase AC 1 00/240V, 1 .4A (50/60 Hz) Dimensions: 331 (W) x 432 (D) x 376 (H) mm (1 3 x 1 7 x 1 4.8 inch) Weight: 16 kg (35 lbs) |
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| Options | 6-position 32 mm automatic sample changer 5-position 40 mm automatic sample chamber Single position 32 mm sample spinner Helium purge Fundamental parameters |
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| Shipping weight | ||
| Dimension with crate |
