NEX QC+ Fluorescence SpectroÂmeter Analyzer
Energy-dispersive X-ray fluorescence (EDXRF) analyzer for elemental analysis.
Key Features:
- Non-destructive analysis for a wide range of elements.
- Advanced elemental analysis with high sensitivity and precision.
- Automatic sample changer and sample spinner for enhanced usability
- Easy-to-use interface with advanced data management, compact and portable design for lab and field use.
- Compliant with various industry standards.
JIS, K 2541, ASTM, D4294, IP, 336, 496, ISO, 20847, 8754
Rigaku NEX QC delivers rapid qualitative and quantitative determination of major and minor atomic elements from sodium through uranium in a wide variety of sample types. Offering simplicity of operation with a modern icon driven smartphone style user interface, the X-ray fluorescence analyzer (XRF analyzer) instrument design was optimized for the demands of production process control environments. An integrated computer and thermal printer provide full functionality without external devices, while built-in Ethernet allows seamless networking to LIMS or other control systems. Options for the Rigaku EDXRF X-ray fluorescence analyzer include a fundamental parameter software module for reducing the number of required calibration standards, an automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.
Features
Accessories
The following accessories are recommended for purchase in sequential order (see eStore):
| 1st Year: | No spare parts are required |
| 2nd Year: | No spare parts are required |
| Remaining Parts: | UPS 230V (recommended) 500VA battery backup with transient surge protection UPS 120V (recommended) 500VA battery backup with transient surge protection Manual Compaction Press Sample Aperture O-ring Carrying Case (Roll Around) Roll of Printer Paper Film, Prolene, 4um, 3″ x 300′ Roll Film. Polypropylene, 6um, 3″ x 300′ Roll Film, Mylar, 6 um, 3″ x 300′ Roll Sample Cups – 40 mm double open ended, 100 pcs. Sample Cups – 32 mm double open ended w/ cap, 100 pcs. Helium Regulator, 2-stage, NPT Connections (second stage to 50 psi) Helium Purge Option (Includes external tubing) Ring, Sample, 40mm Cup Ring, Sample, 32mm Cup Ring, Sample, Flat, 27mm I 32 mm Single Position Sample Spinner 5 and 6 Position Sample Trays with Inserts 5-Position 40 mm Sample Tray with Inserts 6-Position 32 mm Sample Tray with Inserts Fundamental Parameters |
Specs
| Test Method Compliance | ASTM D4294, IP 336, IP 496, ISO 8754, ISO 20847, JIS K2541 | |
| Excitation | 50 kV X-ray tube 4 W max power 6 tube fi lter positions with shutter |
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| Detection | High performance semiconductor detector Peltier thermo-electric cooling Optimum balance of spectral resolution and count rate |
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| Sample chamber | Large 190 x 165 x 60 mm sample chamber Single position 32 mm sample aperture Single position 40 mm sample aperture Bulk sample aperture 6-position 32 mm automatic sample changer 5-position 40 mm automatic sample chamber Single position 32 mm sample spinner Analysis in air or helium |
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| Software and application packages | Qualitative and quantitative analysis Normalization and validation feature Fundamental parameters Data export function with LIMS compatibility User selectable shaping times Simple flow bar wizard to create new applications Icon driven graphical user interface |
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| Environmental conditions | Ambient temperatures 10 – 35°C (50 – 95°F) Relative humidity <85% non condensing Vibration undetectable by human Free from corrosive gas, dust, and particles |
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| User interface | 8” WVGA touch screen interface Embedded computer Internal thermal printer USB and ethernet connections |
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| Spectrometer Data | Single phase AC 1 00/240V, 1 .4A (50/60 Hz) Dimensions: 331 (W) x 432 (D) x 376 (H) mm (1 3 x 1 7 x 1 4.8 inch) Weight: 16 kg (35 lbs) |
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| Options | 6-position 32 mm automatic sample changer 5-position 40 mm automatic sample chamber Single position 32 mm sample spinner Helium purge Fundamental parameters |
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| Shipping weight | ||
| Dimension with crate |
