NEX QC+ EDXRF Analyzer
Enhanced energy-dispersive X-ray fluorescence (EDXRF) analyzer for elemental analysis.
Key Features:
- Non-destructive analysis for a wide range of elements.
- Advanced elemental analysis with next-generation silicon detector technology, providing significant improvements in elemental peak resolution and counting statistics
- Automatic sample changer and sample spinner for enhanced usability
- Easy-to-use interface with advanced data management, compact and portable design for lab and field use.
- Compliant with various industry standards.
ASTM, D4294, IP, 336, 496, ISO, 13032, 20847, 8754, JIS, K 2541
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC spectrometer analyzer. Employing the next generation silicon detector technology, the enhanced NEX QC affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.Request a quote for this fluorescence analyzer today.
Features
Accessories
The following accessories are recommended for purchase in sequential order (see eStore):
1st Year: | No spare parts are required |
2nd Year: | No spare parts are required |
Remaining Parts: | UPS 230V (recommended) 500VA battery backup with transient surge protection UPS 120V (recommended) 500VA battery backup with transient surge protection Manual Compaction Press Sample Aperture O-ring Carrying Case (Roll Around) Roll of Printer Paper Film, Prolene, 4um, 3″ x 300′ Roll Film. Polypropylene, 6um, 3″ x 300′ Roll Film, Mylar, 6 um, 3″ x 300′ Roll Sample Cups – 40 mm double open ended, 100 pcs. Sample Cups – 32 mm double open ended w/ cap, 100 pcs. Helium Regulator, 2-stage, NPT Connections (second stage to 50 psi) Helium Purge Option (Includes external tubing) Ring, Sample, 40mm Cup Ring, Sample, 32mm Cup Ring, Sample, Flat, 27mm I 32 mm Single Position Sample Spinner 5 and 6 Position Sample Trays with Inserts 5-Position 40 mm Sample Tray with Inserts 6-Position 32 mm Sample Tray with Inserts Fundamental Parameters |
Specs
Test Method Compliance | ASTM D4294, IP 336, IP 496, ISO 8754, ISO 13032, ISO 20847, JIS K2541 | |
Excitation | 50 kV X-ray tube 4 W max power 6 tube fi lter positions with shutter |
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Detection | High performance semiconductor detector Peltier thermo-electric cooling Optimum balance of spectral resolution and count rate |
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Sample chamber | Large 190 x 165 x 60 mm sample chamber Single position 32 mm sample aperture Single position 40 mm sample aperture Bulk sample aperture 6-position 32 mm automatic sample changer 5-position 40 mm automatic sample chamber Single position 32 mm sample spinner Analysis in air or helium |
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Software and application packages | Qualitative and quantitative analysis Normalization and validation feature Fundamental parameters Data export function with LIMS compatibility User selectable shaping times Simple flow bar wizard to create new applications Icon driven graphical user interface |
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Environmental conditions | Ambient temperatures 10 – 35°C (50 – 95°F) Relative humidity <85% non condensing Vibration undetectable by human Free from corrosive gas, dust, and particles |
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User interface | 8” WVGA touch screen interface Embedded computer Internal thermal printer USB and ethernet connections |
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Spectrometer Data | Single phase AC 1 00/240V, 1 .4A (50/60 Hz) Dimensions: 331 (W) x 432 (D) x 376 (H) mm (1 3 x 1 7 x 1 4.8 inch) Weight: 16 kg (35 lbs) |
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Options | 6-position 32 mm automatic sample changer 5-position 40 mm automatic sample chamber Single position 32 mm sample spinner Helium purge Fundamental parameters |
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Shipping weight | ||
Dimension with crate |
Downloads
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